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    ICCAD
    2005
    IEEE
    168views Hardware» more  ICCAD 2005»
    Statistical timing analysis driven post-silicon-tunable clock-tree synthesis
    14 years 8 months ago
    Statistical timing analysis driven post-silicon-tunable clock-tree synthesis
    Download  vlsi.ece.wisc.edu
    — Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock t...
    Jeng-Liang Tsai, Lizheng Zhang
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