For submicron integrated circuits, 3D numerical techniques are required to accurately compute the values of the interconnect capacitances. In this paper, we describe an hierarchic...
In this paper, we present a new capacitance extraction method named Dimension Reduction Technique (DRT) for 3D VLSI interconnects. The DRT converts a complex 3D problem into a ser...
Wei Hong II, Weikai Sun, Zhenhai Zhu, Hao Ji, Ben ...
In this paper, we propose a novel statistical capacitance extraction method for interconnects considering process variations. The new method, called statCap, is based on the spect...