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ITC
2003
IEEE
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ITC 2003
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Designed -in-diagnostics: A new optical method
14 years 1 months ago
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www.itcprogramdev.org
An in-circuit diagnostic test structure triggered by a light pulse captures logic states on-chip with picosecond timing accuracy, and the results read out via a scan chain thus pr...
Keneth R. Wilsher
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