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DATE
2000
IEEE
86views Hardware» more  DATE 2000»
14 years 4 months ago
Analysis and Minimization of Test Time in a Combined BIST and External Test Approach
In this paper, an analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test a...
Makoto Sugihara, Hiroto Yasuura, Hiroshi Date