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    DATE
    2000
    IEEE
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    Analysis and Minimization of Test Time in a Combined BIST and External Test Approach
    14 years 16 hour ago
    Analysis and Minimization of Test Time in a Combined BIST and External Test Approach
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    In this paper, an analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test a...
    Makoto Sugihara, Hiroto Yasuura, Hiroshi Date
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