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    Reusing Scan Chains for Test Pattern Decompression
    13 years 11 months ago
    Reusing Scan Chains for Test Pattern Decompression
    Download  www.iti.uni-stuttgart.de
    The paper presents a method for testing a system-on-achip by using a compressed representation of the patterns on an external tester. The patterns for a certain core under test ar...
    Rainer Dorsch, Hans-Joachim Wunderlich
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