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42
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VLSID
2002
IEEE
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VLSI
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VLSID 2002
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Divide-and-Conquer IDDQ Testing for Core-Based System Chips
14 years 12 months ago
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www.cs.york.ac.uk
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
C. P. Ravikumar, Rahul Kumar
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