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31
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VLSID
2008
IEEE
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VLSI
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VLSID 2008
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Total Power Minimization in Glitch-Free CMOS Circuits Considering Process Variation
15 years 7 days ago
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www.eng.auburn.edu
Compared to subthreshold leakage, dynamic power is normally much less sensitive to the process variation due to its approximately linear relation to the process parameters. Howeve...
Yuanlin Lu, Vishwani D. Agrawal
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