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    DATE
    2009
    IEEE
    106views Hardware» more  DATE 2009»
    Generation of compact test sets with high defect coverage
    14 years 7 months ago
    Generation of compact test sets with high defect coverage
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    Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
    Xrysovalantis Kavousianos, Krishnendu Chakrabarty
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