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DATE
2009
IEEE
94views Hardware» more  DATE 2009»
14 years 5 months ago
Improving compressed test pattern generation for multiple scan chain failure diagnosis
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...