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36
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DATE
2009
IEEE
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DATE 2009
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Improving compressed test pattern generation for multiple scan chain failure diagnosis
14 years 6 months ago
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To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
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