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35
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ATS
2010
IEEE
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ATS 2010
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Efficient Embedding of Deterministic Test Data
13 years 8 months ago
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Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
Mudassar Majeed, Daniel Ahlstrom, Urban Ingelsson,...
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