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ET
2002
77views more  ET 2002»
13 years 7 months ago
Reusing Scan Chains for Test Pattern Decompression
The paper presents a method for testing a system-on-achip by using a compressed representation of the patterns on an external tester. The patterns for a certain core under test ar...
Rainer Dorsch, Hans-Joachim Wunderlich
CPM
2010
Springer
175views Combinatorics» more  CPM 2010»
14 years 4 days ago
Compression, Indexing, and Retrieval for Massive String Data
The field of compressed data structures seeks to achieve fast search time, but using a compressed representation, ideally requiring less space than that occupied by the original i...
Wing-Kai Hon, Rahul Shah, Jeffrey Scott Vitter