Sciweavers

ET
2002
77views more  ET 2002»
14 years 8 days ago
Reusing Scan Chains for Test Pattern Decompression
The paper presents a method for testing a system-on-achip by using a compressed representation of the patterns on an external tester. The patterns for a certain core under test ar...
Rainer Dorsch, Hans-Joachim Wunderlich
CPM
2010
Springer
175views Combinatorics» more  CPM 2010»
14 years 5 months ago
Compression, Indexing, and Retrieval for Massive String Data
The field of compressed data structures seeks to achieve fast search time, but using a compressed representation, ideally requiring less space than that occupied by the original i...
Wing-Kai Hon, Rahul Shah, Jeffrey Scott Vitter