DM
2008
14 years 16 days ago
2008
Motivated by a new point of view to study occurrences of consecutive patterns in permutations, we introduce the notion of uniquely k-determined permutations. We give two criteria f...
ATS
2005
IEEE
14 years 6 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...