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VTS
2003
IEEE
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VTS 2003
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Use of Multiple IDDQ Test Metrics for Outlier Identification
14 years 5 months ago
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research.cs.tamu.edu
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
Sagar S. Sabade, D. M. H. Walker
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