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    Test challenges for deep sub-micron technologies
    15 years 19 days ago
    Test challenges for deep sub-micron technologies
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    The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
    Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik...
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