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ATS
2002
IEEE
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ATS 2002
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An Access Timing Measurement Unit of Embedded Memory
14 years 5 months ago
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larc.ee.nthu.edu.tw
As the deep sub-micron techniques evolving, embedded memories are dominating the yield, while the testing and measurement issues are more difficult due to the access limitations. ...
Shu-Rong Lee, Ming-Jun Hsiao, Tsin-Yuan Chang
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