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    DATE
    2006
    IEEE
    66views Hardware» more  DATE 2006»
    On test conditions for the detection of open defects
    14 years 5 months ago
    On test conditions for the detection of open defects
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    The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation resul...
    Bram Kruseman, Manuel Heiligers
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