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    DAC
    2006
    ACM
    141views Computer Architecture» more  DAC 2006»
    Timing-based delay test for screening small delay defects
    15 years 15 days ago
    Timing-based delay test for screening small delay defects
    Download  www.engr.uconn.edu
    The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
    Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
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