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ICCAD
1995
IEEE
120views Hardware» more  ICCAD 1995»
14 years 3 months ago
Pattern generation for a deterministic BIST scheme
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, ...