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36
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ICCAD
1995
IEEE
120
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ICCAD 1995
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Pattern generation for a deterministic BIST scheme
14 years 3 months ago
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www.ra.informatik.uni-stuttgart.de
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, ...
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