MR
2006
14 years 20 days ago
2006
Power semiconductor devices under short-circuit are submitted to high current and high voltage simultaneously that induce high electrical and thermal stresses. Several types of ev...
DATE
2009
IEEE
14 years 7 months ago
2009
IEEE
Current trends in technology scaling foreshadow worsening transistor reliability as well as greater numbers of transistors in each system. The combination of these factors will so...