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TCAD
1998
96views more  TCAD 1998»
13 years 11 months ago
Diagnosis of clustered faults and wafer testing
—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thula...
ICLP
2007
Springer
14 years 5 months ago
Automatic Binding-Related Error Diagnosis in Logic Programs
Abstract. This paper proposes a diagnosis algorithm for locating a certain kind of errors in logic programs: variable binding errors that result act symptoms during compile-time ch...
Pawel Pietrzak, Manuel V. Hermenegildo