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ICCAD
2004
IEEE
101views Hardware» more  ICCAD 2004»
14 years 8 months ago
Frugal linear network-based test decompression for drastic test cost reductions
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
Wenjing Rao, Alex Orailoglu, G. Su