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    VLSID
    2007
    IEEE
    103views VLSI» more  VLSID 2007»
    Impact of Modern Process Technologies on the Electrical Parameters of Interconnects
    14 years 12 months ago
    Impact of Modern Process Technologies on the Electrical Parameters of Interconnects
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    Abstract-- This paper presents the results obtained from an experimental study of the impact of modern process technologies on the electrical parameters of interconnects. Variation...
    Debjit Sinha, Jianfeng Luo, Subramanian Rajagopala...
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