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DATE
2002
IEEE
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DATE 2002
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A Signature Test Framework for Rapid Production Testing of RF Circuits
14 years 5 months ago
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Production test costs for today’s RF circuits are rapidly escalating. Two factors are responsible for this cost escalation: (a) the high cost of RF ATEs and (b) long test times ...
Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhi...
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