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    DAC
    2004
    ACM
    155views Computer Architecture» more  DAC 2004»
    Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
    15 years 15 days ago
    Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
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    The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
    Goeran Jerke, Jürgen Scheible, Jens Lienig
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