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    DATE
    1999
    IEEE
    91views Hardware» more  DATE 1999»
    Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks
    14 years 3 months ago
    Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks
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    In this paper we show that the already known method of using multiplexers for making the inputs and outputs of the embedded blocks accessible by the primary ports of the Integrate...
    Dimitris Nikolos, Haridimos T. Vergos, Th. Haniota...
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