Sciweavers

    DATE
    2003
    IEEE
    104views Hardware» more  DATE 2003»
    A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories
    14 years 4 months ago
    A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories
    Download  www.date-conference.com
    In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the...
    Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza ...
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2024, USA.