ETS
2011
IEEE
13 years 17 days ago
2011
IEEE
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
ENTCS
2008
14 years 27 days ago
2008
We study explicit techniques for detection of safety errors, e.g., depth-first search, directed search, random walk, and bitstate hashing. We argue that it is not important to fin...
SIGSOFT
2006
ACM
15 years 1 months ago
2006
ACM
