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    ICCAD
    1998
    IEEE
    96views Hardware» more  ICCAD 1998»
    Test set compaction algorithms for combinational circuits
    15 years 14 days ago
    Test set compaction algorithms for combinational circuits
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    This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
    Ilker Hamzaoglu, Janak H. Patel
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