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ET
2000
80views more  ET 2000»
14 years 14 days ago
A New Method for Testing Re-Programmable PLAs
: We present a method for obtaining a minimal set of test configurations and their associated set oftest patterns that completely tests re-programmable Programmable Logic Arrays (P...
Charles E. Stroud, James R. Bailey, Johan R. Emmer...
ET
2000
73views more  ET 2000»
14 years 14 days ago
Deterministic BIST with Partial Scan
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
Gundolf Kiefer, Hans-Joachim Wunderlich
ET
2000
98views more  ET 2000»
14 years 14 days ago
Low Power BIST by Filtering Non-Detecting Vectors
Salvador Manich, A. Gabarró, M. Lopez, Joan...
ET
2000
145views more  ET 2000»
14 years 14 days ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar