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ET
2007
57views more  ET 2007»
13 years 7 months ago
Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration
In this paper, we explore general conditions for the oscillation based test of switched-capacitor biquad filter stages. Expressions describing the characteristics of a filter stage...
Uros Kac, Franc Novak
ET
2007
111views more  ET 2007»
13 years 7 months ago
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware
This article describes an emulation-based method for locating stuck-at faults in combinational and synchronous sequential circuits. The method is based on automatically designing a...
Fatih Kocan, Daniel G. Saab
ET
2007
119views more  ET 2007»
13 years 7 months ago
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
ET
2007
69views more  ET 2007»
13 years 7 months ago
Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST
Abstract In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an osci...
Hsin-Wen Ting, Cheng-Wu Lin, Bin-Da Liu, Soon-Jyh ...
ET
2007
67views more  ET 2007»
13 years 7 months ago
A Formal Analysis of Fault Diagnosis with D-matrices
As new approaches and algorithms are developed for system diagnosis, it is important to reflect on existing approaches to determine their strengths and weaknesses. Of concern is i...
John W. Sheppard, S. G. W. Butcher
ET
2007
123views more  ET 2007»
13 years 7 months ago
Defect-tolerant Logic with Nanoscale Crossbar Circuits
Crossbar architectures are one approach to molecular electronic circuits for memory and logic applications. However, currently feasible manufacturing technologies introduce numero...
Tad Hogg, Greg Snider
ET
2007
64views more  ET 2007»
13 years 7 months ago
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips
Fei Su, William L. Hwang, Arindam Mukherjee, Krish...
ET
2007
89views more  ET 2007»
13 years 7 months ago
QCA Circuits for Robust Coplanar Crossing
In this paper, different circuits of Quantum-dot Cellular Automata (QCA) are proposed for the so-called coplanar crossing. Coplanar crossing is one of the most interesting feature...
Sanjukta Bhanja, Marco Ottavi, Fabrizio Lombardi, ...
ET
2007
61views more  ET 2007»
13 years 7 months ago
Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata
The computational paradigm known as quantum-dot cellular automata (QCA) encodes binary information in the charge configuration of Coulomb-coupled quantum-dot cells. Functioning QC...
Mo Liu, Craig S. Lent
ET
2007
65views more  ET 2007»
13 years 7 months ago
RF Testing on a Mixed Signal Tester
In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) will be used for this. A global posit...
Dana Brown, John Ferrario, Randy Wolf, Jing Li, Ja...