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TCAD
2008
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TCAD 2008
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Early Analysis and Budgeting of Margins and Corners Using Two-Sided Analytical Yield Models
14 years 14 days ago
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www.eecg.toronto.edu
Manufacturing process variations lead to variability in circuit delay and, if not accounted for, can cause excessive timing yield loss. The familiar traditional approaches to timin...
Khaled R. Heloue, Farid N. Najm
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