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    DAC
    1997
    ACM
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    ATPG for Heat Dissipation Minimization During Scan Testing
    13 years 11 months ago
    ATPG for Heat Dissipation Minimization During Scan Testing
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    An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
    Seongmoon Wang, Sandeep K. Gupta
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