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31
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DDECS
2007
IEEE
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DDECS 2007
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Layout to Logic Defect Analysis for Hierarchical Test Generation
14 years 5 months ago
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www.pld.ttu.ee
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
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