This site uses cookies to deliver our services and to ensure you get the best experience. By continuing to use this site, you consent to our use of cookies and acknowledge that you have read and understand our Privacy Policy, Cookie Policy, and Terms
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara