ETS
2011
IEEE
13 years 14 days ago
2011
IEEE
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
CAL
2007
14 years 22 days ago
2007
—As transistor feature sizes continue to shrink into the sub-90nm range and beyond, the effects of process variations on critical path delay and chip yields have amplified. A com...