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33
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DATE
2007
IEEE
92
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Hardware
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DATE 2007
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Test quality analysis and improvement for an embedded asynchronous FIFO
14 years 5 months ago
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www.ida.liu.se
Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clock...
Tobias Dubois, Erik Jan Marinissen, Mohamed Aziman...
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