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    DATE
    2010
    IEEE
    180views Hardware» more  DATE 2010»
    Reliability- and process variation-aware placement for FPGAs
    14 years 4 months ago
    Reliability- and process variation-aware placement for FPGAs
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    Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
    Assem A. M. Bsoul, Naraig Manjikian, Li Shang
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