VTS
2000
IEEE
13 years 12 months ago
2000
IEEE
Abstract: This paper presents a notation for describing functional fault models, which may occur in memory devices. Using this notation, the space of all possible memory faults has...
ETS
2007
IEEE
14 years 1 months ago
2007
IEEE
The paper proposes a new concept of diagnosing faulty links in Network-on-a-Chip (NoC) designs. The method is based on functional fault models and it implements packet address dri...