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DATE
2008
IEEE
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DATE 2008
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A Case Study in Reliability-Aware Design: A Resilient LDPC Code Decoder
14 years 7 months ago
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Chip reliability becomes a great threat to the design of future microelectronic systems with the continuation of the progressive downscaling of CMOS technologies. Hence increasing...
Matthias May, Matthias Alles, Norbert Wehn
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