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    DATE
    2009
    IEEE
    135views Hardware» more  DATE 2009»
    Gate replacement techniques for simultaneous leakage and aging optimization
    14 years 2 months ago
    Gate replacement techniques for simultaneous leakage and aging optimization
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    —1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...
    Yu Wang 0002, Xiaoming Chen, Wenping Wang, Yu Cao,...
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