Sciweavers

    ICCAD
    2006
    IEEE
    141views Hardware» more  ICCAD 2006»
    Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques
    14 years 9 months ago
    Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques
    Download  www.ece.rice.edu
    An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
    Mihir R. Choudhury, Quming Zhou, Kartik Mohanram
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2024, USA.