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ICCAD
2006
IEEE
141views Hardware» more  ICCAD 2006»
14 years 8 months ago
Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
Mihir R. Choudhury, Quming Zhou, Kartik Mohanram