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34
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ICCD
2007
IEEE
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ICCD 2007
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Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor
14 years 9 months ago
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www.duke.edu
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz
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