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    Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs
    14 years 12 days ago
    Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs
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    Deuterated oxides exhibit prolonged hot carrier lifetimes at room temperature. We report evidence that this improved hot carrier hardness exists over the temperature range between...
    Cora Salm, André J. Hof, Fred G. Kuper, Jur...
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