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26
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VTS
2006
IEEE
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VTS 2006
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X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data
14 years 2 months ago
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www.cs.colostate.edu
A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measu...
Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. ...
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