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    DAC
    1996
    ACM
    109views Computer Architecture» more  DAC 1996»
    Hot-Carrier Reliability Enhancement via Input Reordering and Transistor Sizing
    14 years 7 months ago
    Hot-Carrier Reliability Enhancement via Input Reordering and Transistor Sizing
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    Hot-carrier eects and electromigration are the two important failure mechanisms that signi cantly impact the long-term reliability of high-density VLSI ICs. In this paper, we prese...
    Aurobindo Dasgupta, Ramesh Karri
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