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ITC
1996
IEEE
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ITC 1996
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IDDQ Test: Sensitivity Analysis of Scaling
14 years 3 months ago
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www.itcprogramdev.org
While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put more functionality on the same piece of silicon. ...
Thomas W. Williams, Robert H. Dennard, Rohit Kapur...
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