Sciweavers

ITC
1996
IEEE
123views Hardware» more  ITC 1996»
14 years 3 months ago
IDDQ Test: Sensitivity Analysis of Scaling
While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put more functionality on the same piece of silicon. ...
Thomas W. Williams, Robert H. Dennard, Rohit Kapur...