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    IOLTS
    2002
    IEEE
    115views Hardware» more  IOLTS 2002»
    Analysis of SEU Effects in a Pipelined Processor
    14 years 4 months ago
    Analysis of SEU Effects in a Pipelined Processor
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    Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo ...
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    IOLTS
    2002
    IEEE
    103views Hardware» more  IOLTS 2002»
    Sequential Circuits Applicable for Detecting Different Types of Faults
    14 years 4 months ago
    Sequential Circuits Applicable for Detecting Different Types of Faults
    Download  muse.tau.ac.il
    Ilya Levin, Vladimir Sinelnikov, Mark G. Karpovsky...
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    IOLTS
    2002
    IEEE
    148views Hardware» more  IOLTS 2002»
    Active Replication: Towards a Truly SRAM-Based FPGA On-Line Concurrent Testing
    14 years 4 months ago
    Active Replication: Towards a Truly SRAM-Based FPGA On-Line Concurrent Testing
    Download  paginas.fe.up.pt
    The reusing of the same hardware resources to implement speed-critical algorithms, without interrupting system operation, is one of the main reasons for the increasing use of reco...
    Manuel G. Gericota, Gustavo R. Alves, Miguel L. Si...
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    IOLTS
    2002
    IEEE
    99views Hardware» more  IOLTS 2002»
    A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
    14 years 4 months ago
    A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
    Download  www.cad.polito.it
    This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
    Davide Appello, Alessandra Fudoli, Vincenzo Tancor...
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    IOLTS
    2002
    IEEE
    127views Hardware» more  IOLTS 2002»
    Fault Tolerance Evaluation Using Two Software Based Fault Injection Methods
    14 years 4 months ago
    Fault Tolerance Evaluation Using Two Software Based Fault Injection Methods
    Download  www.kiv.zcu.cz
    A silicon independent C-Based model of the TTP/C protocol was implemented within the EU-founded project FIT. The C-based model is integrated in the C-Sim simulation environment. T...
    Astrit Ademaj, Petr Grillinger, Pavel Herout, Jan ...
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    IOLTS
    2002
    IEEE
    87views Hardware» more  IOLTS 2002»
    BIST-Based Delay-Fault Testing in FPGAs
    14 years 4 months ago
    BIST-Based Delay-Fault Testing in FPGAs
    Download  www.eng.auburn.edu
    Miron Abramovici, Charles E. Stroud
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