IOLTS
2007
IEEE
14 years 5 months ago
2007
IEEE
i To boost logic density and reduce per unit power consumption SRAM-based FPGAs manufacturers adopted nanometric technologies. However, this technology is highly vulnerable to radi...
IOLTS
2007
IEEE
14 years 5 months ago
2007
IEEE
IOLTS
2007
IEEE
14 years 5 months ago
2007
IEEE
Security of cryptographic circuits is a major concern. Fault attacks are a mean to obtain critical information with the use of physical disturbance and cryptanalysis. We propose a...
IOLTS
2007
IEEE
14 years 5 months ago
2007
IEEE
In this paper we present an efficient design technique for implementing the Elliptic Curve Cryptographic (ECC) Scheme in FPGAs. Our technique is based on a novel and efficient i...
IOLTS
2007
IEEE
14 years 5 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
IOLTS
2007
IEEE
14 years 5 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
IOLTS
2007
IEEE
14 years 5 months ago
2007
IEEE