TII
2008
14 years 10 days ago
2008
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
DATE
2004
IEEE
14 years 4 months ago
2004
IEEE
In this paper, we propose a simple technique for estimating the standard deviation of a Gaussian random jitter component in a multi-gigahertz signal. This method may utilize exist...
DFT
2005
IEEE
14 years 6 months ago
2005
IEEE
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...