Sciweavers

ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
14 years 16 days ago
A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura